gate oxide integrity是什么意思

网络释义

用法例句

A unified percolation model for gate oxide breakdown;

栅氧化层击穿的统一逾渗模型

A physical-based percolation model for gate oxide TDDB;

栅氧化层介质经时击穿的逾渗模型

Experimental Research on Breakdown Characteristics of Thin Gate Oxide;

薄栅氧化层击穿特性的实验研究

Constant voltage and constant current TDDB tests have been done on 2Onm gate oxides.

采用恒定电压和恒定电流试验方法对２０ｎｍ栅氧化层进行了ＴＤＤＢ可靠性评价试验，并完 成了１／Ｅ模型参数提取，给出了恒定电流应力下描述氧化层ＴＤＤＢ退化的统计模型，较好地解释了试验结 果。

gate oxide integrity

栅极氧化层的完整性

Novel Structure Trench E-JFET with Adding Oxide Region beneath Gate

栅极下加氧化层的新型沟槽栅E-JFET仿真研究

Study of the Reliability of the Gate Oxide Related to EEPROM

EEPROM中栅氧化层的可靠性研究

Study on Thermal Stability and Tunneling Current of Ultrathin Gate Oxidation;

超薄栅氧化层的热稳定性和隧道电流研究

Effects of Hydrogen Peroxide on Performance of Anodic Films on AZ 31 Magnesium Alloy

过氧化氢对AZ31镁合金阳极氧化膜层性能的影响

They should remove the field plate and oxide and deposit a thin aluminum film over this region.

他们应当去掉场极板和氧化层，并在整个区域淀积一层薄的铝薄膜。

This voltage creates a field across the gate oxide, which causes the adjacent P substrate to invert to N-type.

这一电压在栅极氧化物层上产生一个电场，它导致毗邻的P型衬底转变成N型。

Study on Monolithic Catalyst for Total Oxidation of Carbon Monoxide;

一氧化碳完全氧化整体催化剂的研究

Study on Plasma Process Induced Damage in Gate Oxide of MOSFET;

等离子体工艺引起的MOSFET栅氧化层损伤研究

Process Monitor of Plasma Charging Damage in Ultra-Thin Gate Oxide

超薄栅氧化层等离子体损伤的工艺监测

A Study on an Environmentally Friendly Anodizing Process of Magnesium Alloys and the Properties of the Anodic Films;

镁合金环保型阳极氧化工艺及膜层性能的研究

Preparation and Evaluation on the Characteristics of Ti-base Metal Oxide Anode Coating Doped with Rare Earth;

钛基金属氧化物—稀土阳极涂层的制备及性能

Fragility of Hard Anodized Film of Al and Its alloys and Countemeasures;

铝及铝合金硬质阳极氧化膜层的脆性及其对策

Preparation of Ru-Mn oxide-coated titanium cathodes and their hydrogen evolution features

Ru-Mn氧化物涂层钛阴极的制备及其析氢性能

To coat(a metallic surface) electrolytically with a protective or decorative oxide.

阳极处理，阳极氧化用电解方式给（金属面）镀上一层保护性或装饰性的氧化物

Study on the Time Dependent Dielectric Breakdown and Reliability Simulation of Ultra-thin Gate Oxides;

超薄栅氧化层经时击穿效应与可靠性仿真技术研究

double poly process

双层多晶硅栅金属氧化物半导体工艺

avalanche injection stacked gate mos

雪崩注入多层栅金属氧化物半导体