The interfacial roughness and periodic structure are investigated through simulation of low angle X-ray diffraction spectra based on the dynamical theory.
用X射线衍射的动力学理论对磁控溅射法制备的Mo/SiO2多层膜低角X射线衍射谱进行拟合,定量分析了膜层的周期结构和界面粗糙度。
CopyRight © 2020-2024 优校网[www.youxiaow.com]版权所有 All Rights Reserved. ICP备案号:浙ICP备2024058711号