A new method,temperature ramp method for rapid evaluation of reliability of microelectronic devices,is proposed and a new model is set up.
提出了一种新的微电子器件快速评价方法-温度斜坡法,建立了确定失效激活能的新模型和寿命外推新模型,使用此模型可计算出单支器件的失效激活能并外推其寿命。
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